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4th Edition of World Nanotechnology Conference

April 25-27, 2022

April 25 -27, 2022 | Las Vegas, USA
2022 Speakers

XRD Studies on Nano Crystalline Ceramic Superconductor

Sumit Kumar Gupta, Speaker at
Parishkar College of Global Excellence, India
Title : XRD Studies on Nano Crystalline Ceramic Superconductor


The purpose of this paper to give an idea about X-ray diffraction techniques that is used for characterization of nanomaterial’s. X-ray diffraction techniques are a  very powerful characterization tool  to  study,  non-destructively,  the  crystallographic  structure,  chemical  composition  and  physical properties  of  materials  and  thin  films  etc.  It  should  also  be  used  to  measure  various  structural properties  of  these  crystalline  phases  such  as  strain,  grain  size,  phase  composition,  and  defect structure.  XRD  is  also  used  to  determine  the  thickness  of  thin  films,  as  well  as  the  atomic arrangements in amorphous materials such as polymers. This review reports the importance of X-ray diffraction technique for the characterization of nanomaterial’s

High-temperature superconductivity in ceramic oxides is a new technology in which advances are occurring at a rapid pace. Here, the author describes some properties of a new nano crystalline ceramic Type II superconductor, PbSrCaCuO. Type II superconductors are usually made of metal alloys or complex oxide ceramics. The PSCCO perovskite phase structure was prepared by the conventional solid state reaction technique. In order to show the viability of the proposed method, super-conducting powder was prepared in special furnace. The sample was analyzed by X-ray Diffraction (XRD), Particle size determination, SEM and EDX. The comparison of XRD results with JCPDS files confirmed the orthorhombic structure of the sample with a ≠ b ≠ c and α = β = γ = 90°. Scanning electron microscopy (SEM) studies revealed that its particle size is in the nanometer range. It also confirmed the calculated value of particle size from Debye Scherrer’s formula. EDX spectrum shows the elements of the sample. X-ray instrumental peak broadening analysis was used to evaluate the size and lattice strain by the Williamson-Hall Plot method.


Dr. Sumit Kumar Gupta Dean, Faculty of Science Parishkar College of Global  Excellence Jaipur, India, in the Department of Physics, With over 16 years of teaching, research, and administrative experience, he has held various administrative positions as the Head of Department in various degree colleges and engineering colleges and has a vast experience of teaching in IIT-JEE Institute.