The purpose of this paper to give an idea about X-ray diffraction techniques that is used for characterization of nanomaterial’s. X-ray diffraction techniques are a very powerful characterization tool to study, non-destructively, the crystallographic structure, chemical composition and physical properties of materials and thin films etc. It should also be used to measure various structural properties of these crystalline phases such as strain, grain size, phase composition, and defect structure. XRD is also used to determine the thickness of thin films, as well as the atomic arrangements in amorphous materials such as polymers. This review reports the importance of X-ray diffraction technique for the characterization of nanomaterial’s
High-temperature superconductivity in ceramic oxides is a new technology in which advances are occurring at a rapid pace. Here, the author describes some properties of a new nano crystalline ceramic Type II superconductor, PbSrCaCuO. Type II superconductors are usually made of metal alloys or complex oxide ceramics. The PSCCO perovskite phase structure was prepared by the conventional solid state reaction technique. In order to show the viability of the proposed method, super-conducting powder was prepared in special furnace. The sample was analyzed by X-ray Diffraction (XRD), Particle size determination, SEM and EDX. The comparison of XRD results with JCPDS files confirmed the orthorhombic structure of the sample with a ≠ b ≠ c and α = β = γ = 90°. Scanning electron microscopy (SEM) studies revealed that its particle size is in the nanometer range. It also confirmed the calculated value of particle size from Debye Scherrer’s formula. EDX spectrum shows the elements of the sample. X-ray instrumental peak broadening analysis was used to evaluate the size and lattice strain by the Williamson-Hall Plot method.