The design of an advance strip cells on PCB board for VNA calibration which allows to measure the MI dependence at frequency up to GHz region has been discussed in this work. Different types of Co-based amorphous glass-coated microwires were investigated showing large MI changes even at GHz frequencies before and after ac-current annealing. It is found that the microwire at low frequency (less than 300 MHz) had the different behaviour in MI than the high frequency (above 300 MHz) which can be useful for the application of tensile stress to control the magnetic anisotropy even at GHz frequencies. Also, the effect of stress on MI at high frequencies in ac-current treatment of amorphous wire has the potential for developing stress sensitive applications especially for wireless operation at microwave frequencies.
J. Alam is an active research engineer working in the department of Technology of Electronic Materials at the National University of Science and Technology ‘NUST’ MISIS, based in Moscow (Russia) since 2017. He completed his BE in Electronics in 2012 from Hamdard University, Karachi (Pakistan). In 2016, he involved in scientific research in the field of magnetism and its applications during his MS degree from NUST MISIS. He is presently a PhD student in NUST MISIS and involves in scientific and technological activities in the field of Soft Magnetic Materials. Current fields of interest: amorphous magnetic micro-nanowires, giant magnetoimpedance ‘GMI’, magnetoelastic effect, stress-sensitive MI, high-performance magnetic sensor devices. He has published more than 3 review articles in international journals and participated in several international magnetic conferences.