Title : Role of Electron Beam-Induced Deposition (EBID) Technique in joining of Broken carbon materials
In this presentation, joining of broken multiwalled carbon nanotubes (MWCNTs) via an electron beam-induced deposition technique is discussed. Current-induced breakdown caused by Joule heating was achieved by applying an appropriate sweep voltage. Scanning electron microscopy images indicated physical joining of broken tubes. To confirm electrical joining of the tubes, current–voltage measurements of the same tube were carried out before and after joining. The current–voltage characteristics remained ohmic after joining of the broken tube. This approach provides a significant tool for repairing CNTs in interconnect technologies and assembly of three-dimensional (3D) nanostructures.