Title : In-situ opto-electro-mechanical characterization of semiconductor nanowire using SEM-based nanomanipulation technique
Abstract:
In the 21st century, nanomaterials play an important role in the field of science and technology, and have a significant impact on various fields of the national economy. Among them, one-dimensional semiconductor nanowires are widely used in nano-optoelectronics (such as nano-photoconductors), new-generation electronic devices (such as nano-FETs), energy conversion (such as nanogenerators) and sustainable energy (such as nano-solar cells) due to their superior physical and chemical properties, optical properties, high-strength mechanical properties and high-performance electrical properties. In order to improve the comprehensive performance of applications equipped with semiconductor nanowires in these important fields, it is essential to accurately characterize their advanced opto-electromechanical coupling properties by experimental methods. In this talk I will give a brief introduction of my investigation regarding this topic.
Although various conventional experimental techniques (such as atomic force microscopy (AFM) and microelectromechanical systems (MEMS)) have been used in the in-situ characterization of the mechanical and electrical properties of semiconductor nanowires, it’s difficult to apply them in the complicated three-field coupling optical-electromechanical characterization. Compared with traditional characterization techniques, in recent years, the emerging SEM nanomanipulation technology combines the advantages of nanoscale spatial resolution and nanoscale positioning accuracy, which can achieve more precise, intuitive and real-time in-situ characterization of nanomaterials. However, as key technologies in the fields of precision equipment, nanomaterials characterization and integrated circuit manufacturing, nanomanipulation technology and scanning electron microscopic imaging technology are still listed as the "bottleneck" technologies that restrict industrial development. However, it is still quite challenging to apply SEM-based nanomanipulation technology to in-situ opto-electromechanical characterization of semiconductor nanomaterials, many difficulties and challenges still exist.
Facing above problems and challenges in the field of opto-electromechanical characterization of semiconductor nanowires, as well as the application bottleneck of SEM nanomanipulation technology, this talk will introduction the establishment of the first in-situ SEM-based nanomanipulation system for coupling opto-electromechanical characterization of semiconductor nanowires, which is expected to have theoretical and practical significance for revealing the complex coupling properties of semiconductor nanomaterials and providing crucial fundamental experimental data the optimization of optoelectronic devices.
Audience Take Away:
- Basic introduction and background knowledge of semiconductor nanowires.
- Merits of advanced nanomaterials.
- Development of the first in-situ SEM-based nanomanipulation system for coupling opto-electromechanical characterization of semiconductor nanowires.
