Nanometrology and advanced characterization are addressed through methods for investigating nanoscale structure, composition, properties and behavior. This session at the World Nanotechnology Conference covers electron and scanning probe microscopy, spectroscopy, chemical mapping, X-ray and scattering techniques, and in-situ or operando analysis. The scope also includes nanoscale mechanical and electrical measurements, calibration, measurement standards and uncertainty. Discussions will connect instrument development and analytical practice with reproducibility, data interpretation and the challenges of examining materials under relevant experimental or operating conditions.
Submissions are invited on new measurement techniques, methodological improvements, multimodal analysis, image processing, reference materials and comparative characterization studies. Research on established instruments and emerging platforms is equally welcome. Microscopists, spectroscopists, metrologists, analytical scientists, materials researchers, instrument developers and students are encouraged to share approaches that strengthen measurement reliability and the interpretation of nanoscale experimental results.
A non-destructive evaluation (NDE) technique capable of testing the dispersion of nanoparticles in a nanocomposite would be of great use to the manufacturing industry in verifying the quality of…
Extensive production of polymer composites reinforced by nanoparticles is hindered by the lack of non-destructive evaluation (NDE) methods capable of ensuring product quality and compliance with…
The microstructural characterization of semiconducting materials is essential to understand their physical properties, as well as device performance in various applications. Among the different…
The utilization of photothermal excitation for the precise activation of microresonators through focused, intensity-modulated light represents a burgeoning field of research with profound…
Food additives are substances intended to become a component or affect the characteristics of food (e.g., emulsifier, stabilizer, thickener, anticaking agent, antioxidant, etc.). Some food additives…
GO (Graphene Oxide) is a 2D nanomaterial that has attracted attention in many industries such as chemical, electronics and medical in recent years. Due to its unique properties such as strength…
Participants can earn 1 CPD credit for each hour of attendance.
Oral and poster slots for original Nanometrology & Advanced Characterization work, reviewed by the scientific committee.
Meet nanotechnologists, researchers, scientists and engineers from around the world across three days.
In-person and virtual registrations include an electronic copy of the abstract book.
Plenary lectures from leading voices shaping Nanometrology & Advanced Characterization research and practice.
Attend in person in Singapore or join virtually — same programme, same certificate.
Oral and poster slots for your work — in person in Singapore or online. Not presenting? Attend as a delegate to learn from the field.
The Nanometrology & Advanced Characterization track is a dedicated stream within World Nano 2027 covering the latest research, innovation, and best practice in Nanometrology & Advanced Characterization. It brings together researchers, educators, and practitioners for oral presentations, posters, and discussion.
Nanotechnology researchers, scientists and engineers, educators and students with an interest in Nanometrology & Advanced Characterization are all welcome — whether presenting or attending.
Yes. Submit an abstract for oral or poster presentation. All submissions are peer-reviewed by the scientific committee.
Yes. World Nano 2027 is a hybrid conference — attend the Nanometrology & Advanced Characterization track in person in Singapore or join live online, with on-demand access afterward.
Singapore · March 18–20, 2027· Hybrid · in-person & virtual
Attend without presenting.
