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12th Edition of World Nanotechnology Conference

March 18-20, 2027 | Singapore
March 18-20, 2027 | Singapore

Nanometrology

Nanometrology

Nanometrology is derived from the Greek words "nanos," which means "one billionth," and "metrologia," which means "ratio theory." It is a branch of metrology concerned with the science of measurement at the nanoscale level, including the quantitative determination of dimensions as well as other physical properties such as electrical, mechanical, optical, magnetic and combinations thereof, chemical and biological properties of nanomaterials, and events occurring at the nanoscale. Nanometrology has only lately been identified as a key to the future of nanotechnology in general, and the development of the NP market in particular. It is the science of measuring dimensions in nanomaterials and nanodevices. Nanometrology is essential for quality control in manufacturing and toxicity research. Nanotechnology would not have achieved its current level of popularity if nanometrology had not existed.

  • Microfluidics and Nanofluidics
  • Microscopy
  • Nanotribology
  • Nano coordinate measuring machine
  • measurement techniques
  • Surface area measurement
Committee Members
Committee Member - Alexander G Ramm

Alexander G Ramm

Kansas State University, United States
Committee Member - Ramesh Agarwal

Ramesh Agarwal

McKelvey School of Engineering, Washington University in St. Louis, United States
Committee Member - Raman Singh

Raman Singh

Monash University, Australia
World Nano 2027 Speakers
Karel Havlicek

Karel Havlicek

Technical University of Liberec, Czech Republic
Magda Nechanicka

Magda Nechanicka

Technical University of Liberec, Czech Republic

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