About the Nanotechnology in metrology Session
Nanotechnology has increased the accuracy and precision of metrology in recent years. It has enabled the development of new types of sensors, transducers, and detectors, which measure and quantify small changes in physical, chemical, and biological systems. Nanotechnology also enables the development of new measurement and analysis techniques, such as atomic force microscopy (AFM), scanning tunneling microscopy (STM), and nano-electron microscopy (NEM). Nanotechnology has enabled the development of nanosensors, which are capable of measuring physical and chemical properties on a nanoscale. This has allowed for the development of more precise and accurate measurements of physical and chemical processes. Nanosensors can be used to measure physical properties such as temperature, pressure, and magnetic fields, as well as chemical properties such as pH, ionic concentrations, and enzyme activity. Nanotechnology also has enabled the development of nanotransducers, which are capable of converting physical and chemical signals into electrical signals. This has allowed for the development of new types of instruments, such as nanoscale electrometers, which measure the electrical resistance of a given material on a nanoscale. Nanotransducers can also be used to measure the mechanical properties of materials, such as stiffness and elasticity.
Topics Covered in Nanotechnology in metrology
Atomic Force Microscopy Calibration
Nanoparticle Size Reference Materials
Critical Dimension Metrology
Nitrogen-Vacancy Magnetometry
Optical Interferometric Displacement Sensing
Tip-Enhanced Raman Spectroscopy
Related Scientific Sessions at World Nano 2027
Why Attend the Nanotechnology in metrology Conference 2027
Earn CPD Credit
Participants can earn 1 CPD credit for each hour of attendance.
Present Your Research
Oral and poster slots for original Nanotechnology in metrology work, reviewed by the scientific committee.
Network Globally
Meet nanotechnologists, researchers, scientists and engineers from around the world across three days.
Abstract Book Included
In-person and virtual registrations include an electronic copy of the abstract book.
Learn from Keynotes
Plenary lectures from leading voices shaping Nanotechnology in metrology research and practice.
Hybrid Flexibility
Attend in person in Singapore or join virtually — same programme, same certificate.
Join World Nano 2027 for the Nanotechnology in metrology track
Oral and poster slots for your work — in person in Singapore or online. Not presenting? Attend as a delegate to learn from the field.
Nanotechnology in metrology Conference 2027 — FAQs
What is the Nanotechnology in metrology track at World Nano 2027?
The Nanotechnology in metrology track is a dedicated stream within World Nano 2027 covering the latest research, innovation, and best practice in Nanotechnology in metrology. It brings together researchers, educators, and practitioners for oral presentations, posters, and discussion.
Who should attend the Nanotechnology in metrology sessions?
Nanotechnology researchers, scientists and engineers, educators and students with an interest in Nanotechnology in metrology are all welcome — whether presenting or attending.
Can I present my research in the Nanotechnology in metrology track?
Yes. Submit an abstract for oral or poster presentation. All submissions are peer-reviewed by the scientific committee.
Is virtual attendance available for Nanotechnology in metrology sessions?
Yes. World Nano 2027 is a hybrid conference — attend the Nanotechnology in metrology track in person in Singapore or join live online, with on-demand access afterward.
Join the World Nano 2027 delegation
Singapore · March 18–20, 2027· Hybrid · in-person & virtual
Attend without presenting.
