Nanotechnology is a rapidly-emerging field of science and engineering that deals with the development and manipulation of extremely tiny materials at the molecular level. As such, it requires the accurate measurement of various physical parameters in order to ensure the successful implementation of any nanotechnology-related project. This includes dimensional measurements, such as length, width, thickness, and other physical parameters such as surface area, volume, electrical resistance, and optical properties. For dimensional measurements, the most commonly used tool is the scanning electron microscope (SEM). This type of microscope is capable of producing images of extremely small objects, including Nanobiotechnology, with a high level of accuracy. This allows scientists to measure the exact dimensions of a given nanomaterial, allowing them to design and fabricate the material to precise specifications. Other physical parameters, such as surface area, volume, and electrical resistance, can be measured using a variety of techniques. The most common of these techniques is X-ray diffraction (XRD). This technique involves the use of X-rays to measure the diffraction pattern of a given material, which can then be used to calculate the physical parameters of the material.





Title : Creating materials with a desired refraction coefficient and other applications
Alexander G Ramm, Kansas State University, United States
Title : Pristine graphene coatings on metals: A disruptive approach to remarkable and durable corrosion
Raman Singh, Monash University, Australia