Nanotechnology is a rapidly-emerging field of science and engineering that deals with the development and manipulation of extremely tiny materials at the molecular level. As such, it requires the accurate measurement of various physical parameters in order to ensure the successful implementation of any nanotechnology-related project. This includes dimensional measurements, such as length, width, thickness, and other physical parameters such as surface area, volume, electrical resistance, and optical properties. For dimensional measurements, the most commonly used tool is the scanning electron microscope (SEM). This type of microscope is capable of producing images of extremely small objects, including Nanobiotechnology, with a high level of accuracy. This allows scientists to measure the exact dimensions of a given nanomaterial, allowing them to design and fabricate the material to precise specifications. Other physical parameters, such as surface area, volume, and electrical resistance, can be measured using a variety of techniques. The most common of these techniques is X-ray diffraction (XRD). This technique involves the use of X-rays to measure the diffraction pattern of a given material, which can then be used to calculate the physical parameters of the material.
Title : Circumventing challenges in developing CVD graphene on steels for extraordinary and durable corrosion resistance
Raman Singh, Monash University, Australia
Title : Evaluating cytotoxicity of metal-doped tin oxide nanoparticles
Paulo Cesar De Morais, Catholic University of Brasilia, Brazil
Title : Nanotechnology and polymers for sea and ocean sterilization using artificial intelligence with artificial intelligence-engineered nano-polymer membranes
Fadi Ibrahim Ahmed, Al-shujaa bin Al-aslam School, Kuwait
Title : Dual memory characteristics and crystallographic transformations in shape memory alloys
Osman Adiguzel, Firat University, Turkey
Title : Flexible fabric-based nanostructured color-generating film systems
Xinhua Ni, Guangzhou City University of Technology, China
Title : A broadband, angle-insensitive aluminium-based near infra-red absorber for protecting warfighters and sensitive optics technologies
Chayanika Baishya, Indian Institute of Technology Guwahati, India