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12th Edition of World Nanotechnology Conference

March 18-20, 2027 | Singapore
March 18-20, 2027 | Singapore

Dimensional and Other Physical Parameters Measurements

Dimensional and Other Physical Parameters Measurements

Nanotechnology is a rapidly-emerging field of science and engineering that deals with the development and manipulation of extremely tiny materials at the molecular level. As such, it requires the accurate measurement of various physical parameters in order to ensure the successful implementation of any nanotechnology-related project. This includes dimensional measurements, such as length, width, thickness, and other physical parameters such as surface area, volume, electrical resistance, and optical properties. For dimensional measurements, the most commonly used tool is the scanning electron microscope (SEM). This type of microscope is capable of producing images of extremely small objects, including Nanobiotechnology, with a high level of accuracy. This allows scientists to measure the exact dimensions of a given nanomaterial, allowing them to design and fabricate the material to precise specifications. Other physical parameters, such as surface area, volume, and electrical resistance, can be measured using a variety of techniques. The most common of these techniques is X-ray diffraction (XRD). This technique involves the use of X-rays to measure the diffraction pattern of a given material, which can then be used to calculate the physical parameters of the material.

Committee Members
Committee Member - Alexander G Ramm

Alexander G Ramm

Kansas State University, United States
Committee Member - Paulo Cesar De Morais

Paulo Cesar De Morais

Catholic University of Brasilia, Brazil
Committee Member - Thomas J Webster

Thomas J Webster

Brown University, United States
World Nano 2027 Speakers
Karel Havlicek

Karel Havlicek

Technical University of Liberec, Czech Republic
Magda Nechanicka

Magda Nechanicka

Technical University of Liberec, Czech Republic

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Dimensional and Other Physical Parameters Measurements | Scientific Sessions | World Nano