An atomic force microscope (AFM) is a powerful tool used in nanotechnology to image and manipulate nanoscale structures. The AFM is an advanced scanning probe microscope that utilizes a sharp tip attached to a cantilever to interact with a sample surface. The tip is moved in a raster-like pattern over the surface of the sample, and the relative height of the sample is measured as the cantilever is deflected by the sample’s surface features. The resulting image is a topographical map of the sample surface at a nanometer scale. The AFM is capable of providing a variety of imaging modes, including amplitude modulation mode, phase-contrast mode, and lateral force mode. Furthermore, the AFM can be used to measure nanoscale forces and measure the mechanical properties of materials. Additionally, the AFM can be used to manipulate nanoscale structures, such as manipulating individual atoms and molecules. This capability makes the AFM an invaluable tool in nanotechnology research. The AFM has a wide range of applications, such as the characterization of surfaces and materials, the study of biological systems, and the fabrication of nanoscale structures. The AFM is also being used in the development of novel Nanobiotechnology and nanodevices. In addition, the AFM is being used to study the properties of nanoscale materials and to develop novel nanotechnology-based devices and systems. The AFM is a powerful tool that has enabled significant advances in nanotechnology research and development.
The utilization of photothermal excitation for the precise activation of microresonators through focused, intensity-modulated light represents a burgeoning field of research with profound…
We show that charge states of adsorbed oxygen adatoms on rutile TiO2(110)-1×1 surface can be measured and deliberately manipulated by a combination of noncontact atomic force microscopy and Kelvin…
Despite water being a ubiquitous substance, it is surprising that some basic questions are still debated. Here using a combination of experimental (cryogenic STM/AFM) and theoretical (first-principle…
Participants can earn 1 CPD credit for each hour of attendance.
Oral and poster slots for original Atomic Force Microscope work, reviewed by the scientific committee.
Meet nanotechnologists, researchers, scientists and engineers from around the world across three days.
In-person and virtual registrations include an electronic copy of the abstract book.
Plenary lectures from leading voices shaping Atomic Force Microscope research and practice.
Attend in person in Singapore or join virtually — same programme, same certificate.
Oral and poster slots for your work — in person in Singapore or online. Not presenting? Attend as a delegate to learn from the field.
The Atomic Force Microscope track is a dedicated stream within World Nano 2027 covering the latest research, innovation, and best practice in Atomic Force Microscope. It brings together researchers, educators, and practitioners for oral presentations, posters, and discussion.
Nanotechnology researchers, scientists and engineers, educators and students with an interest in Atomic Force Microscope are all welcome — whether presenting or attending.
Yes. Submit an abstract for oral or poster presentation. All submissions are peer-reviewed by the scientific committee.
Yes. World Nano 2027 is a hybrid conference — attend the Atomic Force Microscope track in person in Singapore or join live online, with on-demand access afterward.
Singapore · March 18–20, 2027· Hybrid · in-person & virtual
Attend without presenting.
